08:30 Welcome and Introductions
08:45 Overview – History of PAC Systems
A. From E/M to Digital PAC Systems
B. Benefits of Testing
09:00 How Electromechanical Devices "were" tested. (1950's-1970's)
C. Lowest Common Denominator
D. Test Equipment – Variacs, Load Box, Timers
E. What went right? What went wrong?
09:30 Demonstration of E/M Testing – Old and New
F. Typical Feeder Protection
G. Old Test Methods
H. Test Methods Today
10:00 Coffee Break
10:20 Testing Static and Early uProcessor Relays (1970's-1980's)
I. The Protection Relay begins to evolve
J. Testing begins to change
K. How the industry tried to adapt
10:45 Demonstration of Static/uProc Testing – Old and New
L. Test equipment begins to integrate
M. Challenges of the new testing technology
11:15 Testing Modern Digital Relays (1990's to 2010)
N. Economics drives innovation
O. Lessons Learned – going Digital
P. PAC Devices changed – but we didn't – New Testing Issues
12:00 Lunch
13:00 Demonstration of Modern Digital Relay Testing – Old and New
Q. Functional Testing is killing us.
R. System Testing begins to break out.
13:45 Testing Digital Communication Based Devices (2010 to Future)
S. Where Did All the Relay Engineers Go?
T. It's a New World Full of Messages
U. Time is a New Commodity
14:30 Demonstration of Digital Comm-Based Device Testing – It's New!
V. System Testing to Closed Loop Testing
15:00 Coffee Break
15:20 Leveraging Technology to Test It All – Satisfy NERC/FERC Easier/Faster
W. Now it's about documentation, manhours, costs, reliability.
X. Use the Technology, don't fight it
Y. Keep the old schemes alive and well – NERC 'em!
16:00 Open Forum for Q&A and Hands On.
Z. Step Up and You Test it!
17:00 Workshop Closed
